SAPIEN MASSA —

Nanos

 

La nostra Mission: rendere la microscopia elettronica accessibile dovunque ed a chiunque!

Il SEM NANOS è basato su tecnologia di ultima generazione, davvero compatto e robusto e munito di microanalisi.

Viene pilotato da un PC All-in-One, ed è dotato di una interfaccia grafica semplice ed intuitiva.

NANOS è l’ideale per utilizzo in ambito industriale o per alleggerire il lavoro di microscopi floor-type in facilities di microscopia elettronica.

Caratteristiche Principali:

 

  • Rilevatori SE & 4Quad BSE di nuova concezione e di elevate prestazioni.
  • Analisi EDX puntuale e mapping elementale
  • Modalità di funzionamento Low Vacuum, per campioni non conduttivi
  • Tavolino porta-campione con movimentazione XY motorizzata e stage di rotazione (tilt) eucentrica.
  • Ottimizzazione performance/durata del filamento
  • Interfaccia grafica semplice ed intuitiva
  • Bassi costi di esercizio e manutenzione
  • Risoluzione Spettacolare!

Specifiche

Software

Optical

Magnification range: 2 – 12x 

SEM

Magnification range: 50 - 200.000x

Resolution

<10 nm

Illumination

Optical

Bright field

SEM

Optimized thermionic source (tungsten)

Acceleration voltages

Default: 1, 2, 5, 7, 10, 15 & 20 kV

Adjustable range between 1 & 20kV

DETECTOR

Secondary electron detector (SED)
Backscattered electron detector (BSD) – 4 quadrant
Energy Dispersive Spectroscopy detector (EDS) – integrated

DIGITAL IMAGE DETECTION

Optical

Colour navigation camera

IMAGE FORMATS

JPEG, TIFF, PNG, BMP

USER INTERFACE

Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard

Remote control (e.g. iPad) enabled

Basic & advanced modes

DATA STORAGE

Network, USB, workstation

SAMPLE STAGE

Eucentric tilt stage (-15 up to +40 ̊)

Computer-controlled motorized X, Y: 25 x 25 mm

SAMPLE SIZE

25 mm diameter pin stub

60 mm diameter round disk

EDS SPECIFICATIONS

Detector type

Silicon Drift Detector (SDD), thermo-electrically cooled

Detector active area

30 mm2

Energy resolution

@ Mn Kα < 133 eV

Max. input count rate

300,000 cps

Hardware integration

Fully embedded

SOFTWARE

Integrated in NANOS user interface

EDS analysis and mapping

Export functions

SYSTEM SPECIFICATIONS

Imaging module

280 (w) x 630 (d) x 550 (h)

Weight

60 Kg

Pumps

Turbo molecular pump with oil free membrane pre-vacuum pump

Vacuum Modes

High vacuum SEM (conventional SEM), and low vacuum 0.4 mbar (low vac SEM)

Controlled vacuum levels via the User Interface

Workstation

Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed

 

 
 
 
SOFTWARE
Optical
Magnification range: 2 – 12x
 
SEM
Magnification range: 50 - 200.000x
 
Resolution
<10 nm
ILLUMINATION
Optical
Bright field
 
SEM
Optimized thermionic source (tungsten)
 
Acceleration voltages
Default: 1, 2, 5, 7, 10, 15 & 20 kV
 
 
Adjustable range between 1 & 20kV
DETECTOR
 
Secondary electron detector (SED)
 
 
Backscattered electron detector (BSD) – 4 quadrant
 
 
Energy Dispersive Spectroscopy detector (EDS) – integrated
DIGITAL IMAGE DETECTION
Optical
Colour navigation camera
IMAGE FORMATS
 
JPEG, TIFF, PNG, BMP
USER INTERFACE
 
Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard
 
 
Remote control (e.g. iPad) enabled
 
 
Basic & advanced modes
DATA STORAGE
 
Network, USB, workstation
SAMPLE STAGE
 
Eucentric tilt stage (-15 up to +40 ̊)
 
 
Computer-controlled motorized X, Y: 25 x 25 mm
SAMPLE SIZE
 
25 mm diameter pin stub
 
 
60 mm diameter round disk
EDS SPECIFICATIONS
Detector type
Silicon Drift Detector (SDD), thermo-electrically cooled
 
Detector active area
30 mm2
 
Energy resolution
@ Mn Kα < 133 eV
 
Max. input count rate
300,000 cps
 
Hardware integration
Fully embedded
SOFTWARE
 
Integrated in NANOS user interface
 
 
EDS analysis and mapping
 
 
Export functions
SYSTEM SPECIFICATIONS
Imaging module
280 (w) x 630 (d) x 550 (h)
 
Weight
60 kg
 
Pumps
Turbo molecular pump with oil free membrane pre-vacuum pump
 
Vacuum modes
High vacuum SEM (conventional SEM), and low vacuum 0.4 mbar (low vac SEM)
 
 
Controlled vacuum levels via the User Interface
 
Workstation
Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed
 

Uffici —

Schaefer SEE s.r.l.

via Luigi Einaudi 23

Italy-45100 Rovigo

CONTATTI —

+39 0425 073 130

bariani@schaefer-tec.it